Equipment Failure Analysis

1. Home
2. Equipment: Failure Analysis

SEM EDX System

JOEL (SEM) / Oxford (EDX)

• SEM resolution: 4.0 nm @ 30 kV
• EDX resolution: 137 eV @ 5.9 keV
• Acceleration Voltage: 0.5 - 30 kV
• Stage movements: 10 mm × 20 mm

Categories

• Sample Preparation
• Processing and Assembly
• Material Characterization
• Opto-Electrical Characterization
• Mechanical Reliability Test
• Long Term Reliability Test
• Failure Analysis
• 3D printing

Equipment

• Grinder
• Automatic Polisher
• Optical Microscope
• Stereo Microscope
• SEM EDX System